1. Testing and reliable design of CMOS circuits
پدیدآورنده : Jha, Niraj K.
کتابخانه: Library of Niroo Research Institue (Tehran)
موضوع : ، Metal oxide semiconductors, Complimentary- Testing,، Metal oxide semiconductors, Complimentary- Reliability,، Integrated circuits- Very large scale integration- Design and construction
2. Testing and reliable design of CMOS circuits
پدیدآورنده : Jha, Niraj K.
کتابخانه: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
موضوع : ، Metal oxide semiconductors, Complimentary -- Testing,، Metal oxide semiconductors, Complimentary -- Reliability,، Integrated circuits -- Very large scale integration -- Design and construction
رده :
TK
7871
.
99
.
M44
J49
